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Applied Physics Reviews (1980-2013) -

scitation.aip.org/content/aip/journal/apr/2001/1

... oscillations are caused by traveling high-electric-field domains that are formed as a re-sult of electric-field-enhanced electron trapping. This article describes the various types of experiments that have been carried out with this system, ... more pages


Journal of Physical and Chemical Reference Data - Volume 26, Issue 1

scitation.aip.org/content/aip/journal/jpcrd/26/1

... our knowledge no measurements are available of the cross sections of any of the electron scattering processes (elastic, momentum, vibrational, inelastic, etc.) or the electron tr-ansport, attachment, and ionization coefficients. While the ... more pages


Journal of Physical and Chemical Reference Data - Volume 32, Issue 1

scitation.aip.org/content/aip/journal/jpcrd/32/1

... layered metal oxides with correlated electrons Taking whispering gallery-mode single virus detection and sizing to the limit Electron transport properties of carbon nanotube–gra-phene contacts Terms & conditions Privacy Advertising ... more pages


Journal of Physical and Chemical Reference Data - Volume 18, Issue 4

scitation.aip.org/content/aip/journal/jpcrd/18/4

... 1637 (1989) ; http://dx.doi.org/10.1063/1.555843 View Description Hide Description Reduction of an electron acceptor (oxidant), A, or oxidation of an electron donor (reductant), A 2 − , is often achieved stepwise v i a one‐electron ... more pages


IEEE

www.techstreet.com/publishers/ieee

... IEEE is the world's largest technical professional society, serving members in compu-ting, electrical engineering and electronics. Comprised of 37 societies and councils, IEEE publishes technical journals, magazines, proceedings, and ... more pages


Journal of Physical and Chemical Reference Data - Volume 8, Issue 2

scitation.aip.org/content/aip/journal/jpcrd/8/2

... Recently Viewed Content Data acquisition system to interface between imaging instrum-ents and the network: Applications in electron microscopy and ultrasound US Air Force starts cybersecurity audit Conductive-AFM topography and current maps ... more pages


Applied Physics Reviews (1980-2013) -

scitation.aip.org/content/aip/journal/apr/1983/1

... electrons in the scanning electron microscope are described. The contrast mechanisms in the scanning electron microscope,material, topography, voltage, magnetic, and cryst-allographic orientation contrast based on secondary electron ... more pages


Journal of Physical and Chemical Reference Data - Volume 6, Issue 1

scitation.aip.org/content/aip/journal/jpcrd/6/1

... band system is discussed in detail, and tables of band origins and heads are given. In addition to the gas phase electronic, electron and Raman spectra, there are also examined the spectra of condensed molecular nitrogen as well as the ... more pages


Journal of Physical and Chemical Reference Data - Volume 29, Issue 4

scitation.aip.org/content/aip/journal/jpcrd/29/4

... View Description Hide Description Low-energy electron collision data for the plasma pr-ocessing gas are sparse. Limited cross section data are available only for total and differe-ntial elastic electron scattering, electron-impact ionization ... more pages


Journal of Physical and Chemical Reference Data - Volume 7, Issue 4

scitation.aip.org/content/aip/journal/jpcrd/7/4

... 7 (1978) Volume 6 (1977) Volume 5 (1976) Volume 4 (1975) Volume 3 (1974) Volume 2 (1973) Volume 1 (1972) Recommended atomic electron binding energies, 1 s to 6 p 3/2 , for the heavy elements, Z =84 to 103 F. T. Porter  and M. S. Freedman ... more pages


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