scitation.aip.org/content/aip/journal/apr/2001/1

... oscillations are caused by traveling high-electric-field domains that are formed as a re-sult of electric-field-enhanced electron trapping. This article describes the various types of experiments that have been carried out with this system, ... more pages

scitation.aip.org/content/aip/journal/jpcrd/26/1

... our knowledge no measurements are available of the cross sections of any of the electron scattering processes (elastic, momentum, vibrational, inelastic, etc.) or the electron tr-ansport, attachment, and ionization coefficients. While the ... more pages

scitation.aip.org/content/aip/journal/jpcrd/32/1

... layered metal oxides with correlated electrons Taking whispering gallery-mode single virus detection and sizing to the limit Electron transport properties of carbon nanotube–gra-phene contacts Terms & conditions Privacy Advertising ... more pages

scitation.aip.org/content/aip/journal/jpcrd/18/4

... 1637 (1989) ; http://dx.doi.org/10.1063/1.555843 View Description Hide Description Reduction of an electron acceptor (oxidant), A, or oxidation of an electron donor (reductant), A 2 − , is often achieved stepwise v i a one‐electron ... more pages

www.techstreet.com/publishers/ieee

... IEEE is the world's largest technical professional society, serving members in compu-ting, electrical engineering and electronics. Comprised of 37 societies and councils, IEEE publishes technical journals, magazines, proceedings, and ... more pages

scitation.aip.org/content/aip/journal/jpcrd/8/2

... Recently Viewed Content Data acquisition system to interface between imaging instrum-ents and the network: Applications in electron microscopy and ultrasound US Air Force starts cybersecurity audit Conductive-AFM topography and current maps ... more pages

scitation.aip.org/content/aip/journal/apr/1983/1

... electrons in the scanning electron microscope are described. The contrast mechanisms in the scanning electron microscope,material, topography, voltage, magnetic, and cryst-allographic orientation contrast based on secondary electron ... more pages

scitation.aip.org/content/aip/journal/jpcrd/6/1

... band system is discussed in detail, and tables of band origins and heads are given. In addition to the gas phase electronic, electron and Raman spectra, there are also examined the spectra of condensed molecular nitrogen as well as the ... more pages

scitation.aip.org/content/aip/journal/jpcrd/29/4

... View Description Hide Description Low-energy electron collision data for the plasma pr-ocessing gas are sparse. Limited cross section data are available only for total and differe-ntial elastic electron scattering, electron-impact ionization ... more pages

scitation.aip.org/content/aip/journal/jpcrd/7/4

... 7 (1978) Volume 6 (1977) Volume 5 (1976) Volume 4 (1975) Volume 3 (1974) Volume 2 (1973) Volume 1 (1972) Recommended atomic electron binding energies, 1 s to 6 p 3/2 , for the heavy elements, Z =84 to 103 F. T. Porter  and M. S. Freedman ... more pages